The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Jan. 15, 2009
Applicants:
Tetsuya Shirota, Tokyo, JP;
Takashi Yoneyama, Sagamihara, JP;
Yasuko Ishii, Tokyo, JP;
Inventors:
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 5/243 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope system which is capable of changing observation states by driving various optical members and which includes a history record unit for recording history data related to a microscope operation history, a selection unit for selecting one or more microscope operation items from among a plurality of microscope operation items, and a state reproduction unit for reproducing a microscope state on the basis of a microscope operation item(s) selected by the selection unit and on the basis of a microscope operation history related to history data recorded in the history record unit.