The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Oct. 20, 2010
Takashi Yoneyama, Tokyo, JP;
Takashi Yoneyama, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The number of seams between magnified images in a created virtual slide is reduced to make the virtual slide clear and sharp. Provided is a microscope apparatus including an objective lens that collects light from a sample on a slide; a focus position detecting section that detects a focus position of the objective lens with respect to the sample; a focus state adjustment section that adjusts a focus state with respect to the sample based on a detection result from the focus position detecting section; and a magnified-image acquisition section that acquires a magnified image of each part of the sample, in which, if the focus position detected by the focus position detecting section is changed by more than a predetermined threshold with respect to a focus state in which an adjacent magnified image was obtained, the focus state adjustment section limits the adjustment in the focus state to the predetermined threshold or less.