The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Mar. 09, 2021
Evident Corporation, Nagano, JP;
Tatsuo Nakata, Tokyo, JP;
Akifumi Kabeya, Tokyo, JP;
Takashi Yoneyama, Tokyo, JP;
Hiroshi Sasaki, Tokyo, JP;
Evident Corporation, Nagano, JP;
Abstract
A microscope system comprising an eyepiece, an objective that guides light from a sample to the eyepiece, a tube lens that is disposed on a light path between the eyepiece and the objective and forms an optical image of the sample on the basis of light therefrom, a projection apparatus that projects a projection image including a first assistance image onto an image plane on which the optical image is formed, and a processor that performs processes. The processes include generating projection image data representing the projection image. The first assistance image is an image of the sample in which a region wider than an actual field of view corresponding to the optical image is seen, The first assistance image is projected onto a portion of the image plane that is close to an outer edge of the optical image.