Takafumi Okabe

This inventor holds 30 USPTO granted patents and 1 published patent application, primarily in Pattern Inspection Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd.. Active years: 1988-2014.

USPTO Granted Patents = 30 (Patent Applications = 1)

% Patents Active = 40.0

Average Co-Inventor Count = 3.9

ph-index = 12

Forward Citations = 424(Granted Patents)

Location History:

Tokyo, JP (2004 - 2008)
Yokohama, JP (1988 - 2014)

Company Filing History:

16 out of 2,874

Hitachi-High-Technologies Corporation

where one patent can have more than one assignee

Years Active: 1988-2014

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Areas of Expertise:

Pattern Inspection

Defect Detection

Semiconductor Manufacturing

Image Alignment

Comparative Inspection

Microscopic Inspection

Inspection Apparatus

Positional Shift Calculation

Three-Dimensional Vision

30 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8639019 - Method and apparatus for inspecting pattern defects (2014-01-28),

2. 8275190 - Method and apparatus for inspecting pattern defects (2012-09-25),

3. 8253934 - Method and apparatus for inspecting a pattern formed on a substrate (2012-08-28),

4. 8090187 - Pattern inspection method and its apparatus (2012-01-03),

5. 8005292 - Method and apparatus for inspecting pattern defects (2011-08-23),

6. 7949178 - Pattern inspection method and its apparatus (2011-05-24),

7. 7903249 - Method and apparatus for inspecting pattern defects (2011-03-08),

8. 7869966 - Inspection method and its apparatus, inspection system (2011-01-11),

9. 7792352 - Method and apparatus for inspecting pattern defects (2010-09-07),

10. 7711178 - Pattern inspection method and its apparatus (2010-05-04),

11. 7646477 - Method and apparatus for inspecting a pattern formed on a substrate (2010-01-12),

12. 7508973 - Method of inspecting defects (2009-03-24),

13. 7489395 - Method and apparatus for inspecting pattern defects (2009-02-10),

14. 7433508 - Pattern inspection method and its apparatus (2008-10-07),

15. 7388979 - Method and apparatus for inspecting pattern defects (2008-06-17),

Title: Takafumi Okabe: Pioneering Inventor from Yokohama

Introduction: Takafumi Okabe is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takafumi Okabe holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the industry, Takafumi Okabe has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various sectors.

Collaborations: Throughout his career, Takafumi Okabe has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing within the industry.

Conclusion: Takafumi Okabe's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.