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Kanagawa, Japan

Takafumi Inoue

USPTO Granted Patents = 16

Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 33(Granted Patents)

Location History:

Kanagawa, JP (2012 - 2017)
Chigasaki, JP (2018 - 2023)

Company Filing History:

Nuflare Technology, Inc.

Years Active: 2012-2023

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16 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11688058 - Pattern inspection apparatus and pattern inspection method (2023-06-27),

2. 11145050 - Pattern inspection apparatus and pattern inspection method (2021-10-12),

3. 10565704 - Inspection method and inspection system (2020-02-18),

4. 10540561 - Inspection method and inspection apparatus (2020-01-21),

5. 10460435 - Pattern inspection method and pattern inspection apparatus (2019-10-29),

6. 10281415 - Pattern inspection method and pattern inspection apparatus (2019-05-07),

7. 9922415 - Inspection method, inspection apparatus, and inspection system (2018-03-20),

8. 9710905 - Mask inspection apparatus and mask inspection method (2017-07-18),

9. 9235883 - Inspection system and method (2016-01-12),

10. 9202270 - Pattern inspection apparatus and pattern inspection method (2015-12-01),

11. 9165355 - Inspection method (2015-10-20),

12. 9057711 - Inspection apparatus and method (2015-06-16),

13. 8903158 - Inspection system and inspection method (2014-12-02),

14. 8861832 - Inspection system and method (2014-10-14),

15. 8548223 - Inspection system and method (2013-10-01),

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