The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Mar. 11, 2013
Applicant:

Nuflare Technology, Inc., Numzau-shi, JP;

Inventors:

Takafumi Inoue, Kanagawa, JP;

Nobutaka Kikuiri, Tokyo, JP;

Ikunao Isomura, Kanagawa, JP;

Assignee:

NuFlare Technology, Inc., Numazu-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); H01L 21/68 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/001 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A mask has an inspection region virtually divided by a plurality of stripes. A position error-correcting unit is disposed on a stage in a region different from the mask, formed with patterns divided virtually by the plurality of stripes. A first deviation amount acquiring circuit acquires a first deviation amount from the optical image and the reference image of the position error correction unit. A second deviation amount acquiring circuit acquires a second deviation amount. A position correcting circuit corrects a positional relationship between the mask and the position error correction unit based on the first deviation amount, and obtains a fluctuation value of position coordinates of each pattern in the inspection region of the mask based on the second deviation amount and corrects the position coordinates.


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