Steven R Lange

Title: **Innovative Contributions of Steven R. Lange in X-Ray Imaging and Semiconductor Inspection**

Introduction

Steven R. Lange, based in Alamo, California, is an accomplished inventor with a remarkable portfolio of 21 patents. His innovative work primarily focuses on advanced imaging technologies and semiconductor inspection, contributing significantly to the fields of materials analysis and quality assurance.

Latest Patents

Among Steven's most recent patents is a cutting-edge **system and method for x-ray imaging and classification of volume defects**. This invention enables the identification of volume defects within a three-dimensional structure by acquiring coherent diffraction images through a transmission-mode x-ray diffraction imaging tool. The process further classifies these defects and trains additional optical or electron-based inspection tools based on the classified results.

Another notable patent is related to **inspection systems and techniques with enhanced detection**. This innovation encompasses methods and apparatus for inspecting semiconductor samples. It involves selecting different wavelength ranges for various layers of interest on semiconductor materials based on the presence of absorber type materials. By directing incident beams at these wavelength ranges, it captures output signals or images that are analyzed to detect defects in the analyzed layers.

Career Highlights

Steven Lange has made significant strides in his career, particularly through his association with reputable companies like Kla Tencor Corporation and Kla-Tencor Technologies Corporation. His work in these organizations has been pivotal in developing technologies that enhance detection capabilities in various imaging and inspection domains.

Collaborations

Throughout his career, Steven has collaborated with prominent professionals in the field. Noteworthy coworkers include Eliezer Rosengaus and Robert M. Danen, with whom he has worked on innovative projects that have pushed the boundaries of imaging and semiconductor inspection technologies.

Conclusion

In conclusion, Steven R. Lange's contributions to x-ray imaging and semiconductor inspection have paved the way for advancements in technology. His inventive spirit and collaboration with esteemed colleagues continue to influence the industry, promising a future of enhanced detection and analysis capabilities in various applications.