Company Filing History:

28 out of 2,508

Ebara Corporation

patents

5 out of 52,711

Kabushiki Kaisha Toshiba

4. 1 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 2002-2016

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29 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9368314 - Inspection system by charged particle beam and method of manufacturing devices using the system (2016-06-14),

2. 8822919 - Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former (2014-09-02),

3. 8803103 - Inspection system by charged particle beam and method of manufacturing devices using the system (2014-08-12),

4. 8368031 - Inspection system by charged particle beam and method of manufacturing devices using the system (2013-02-05),

5. 8053726 - Inspection system by charged particle beam and method of manufacturing devices using the system (2011-11-08),

6. 7928378 - Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former (2011-04-19),

7. 7888642 - Electron beam apparatus and method of manufacturing semiconductor device using the apparatus (2011-02-15),

8. 7829871 - Sheet beam-type testing apparatus (2010-11-09),

9. 7745784 - Electron beam apparatus and method of manufacturing semiconductor device using the apparatus (2010-06-29),

10. 7601972 - Inspection system by charged particle beam and method of manufacturing devices using the system (2009-10-13),

11. 7439502 - Electron beam apparatus and device production method using the electron beam apparatus (2008-10-21),

12. 7423267 - Electron beam apparatus and method of manufacturing semiconductor device using the apparatus (2008-09-09),

13. 7417236 - Sheet beam-type testing apparatus (2008-08-26),

14. 7411191 - Inspection system by charged particle beam and method of manufacturing devices using the system (2008-08-12),

15. 7408175 - Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former (2008-08-05),

Title: Shin Oowada: Pioneering Inventor from Kanagawa

Introduction: Shin Oowada is a renowned inventor hailing from Kanagawa, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Shin Oowada holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Shin Oowada has worked with leading tech companies and research institutions, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Shin Oowada has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Shin Oowada's relentless pursuit of innovation and his passion for creating solutions to complex challenges have solidified his reputation as a visionary inventor in the global tech community.

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Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.