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Ryo Tajima

USPTO Granted Patents = 15 (Patent Applications = 1)

Average Co-Inventor Count = 3.9

ph-index = 4

Forward Citations = 138(Granted Patents)

Location History:

Yokohama, JP (2008)
Fujisawa, JP (2011)
Kanagawa-ken, JP (2006 - 2016)
Tokyo, JP (2015 - 2022)

Company Filing History:

15 out of 2,510

Ebara Corporation

Years Active: 2006-2025

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15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12243710 - Electron beam irradiation apparatus with overlapping beam columns and helping columns (2025-03-04),

2. 11515118 - Electron beam irradiation apparatus and electron beam alignment method (2022-11-29),

3. 11217421 - Adjustment method and electron beam device (2022-01-04),

4. 10707048 - Deflection sensitivity calculation method and deflection sensitivity calculation system (2020-07-07),

5. 10446404 - Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus (2019-10-15),

6. 10002740 - Inspection device (2018-06-19),

7. 9852878 - Surface processing apparatus (2017-12-26),

8. 9406480 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2016-08-02),

9. 9105445 - Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recorded (2015-08-11),

10. 8946631 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2015-02-03),

11. 8742341 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2014-06-03),

12. 8013315 - Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same (2011-09-06),

13. 7741601 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2010-06-22),

14. 7365324 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2008-04-29),

15. 7138629 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2006-11-21),

Title: The Innovative Journey of Ryo Tajima

Introduction: Ryo Tajima, a pioneering inventor hailing from Tokyo, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Ryo Tajima holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With over two decades of experience in research and development, Ryo Tajima has worked with leading tech companies and research institutions, spearheading projects that have pushed the boundaries of innovation.

Collaborations: Throughout his career, Ryo Tajima has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence in all his endeavors.

Conclusion: Ryo Tajima's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

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