Philippe Gastaldo

This inventor holds 17 USPTO granted patents and 15 EPO patents. Top assignees: Unity Semiconductor Corporation, Altatech Semiconductor, Saint-Augustin Canada Electric Inc.. Active years: 2010-2024.

USPTO Granted Patents = 17

% Patents Active = 94.1

EPO Patents = 15 (Patent Applications = 16)

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 31(Granted Patents)

Location History:

Pontcharre, FR (2016 - 2019)
Pontcharra, FR (2010 - 2024)

Company Filing History:

7 out of 301

Unity Semiconductor Corporation

patents

5 out of 7

Altatech Semiconductor

patents

3 out of 37

Saint-Augustin Canada Electric Inc.

patents

4. 1 out of 1

Alatech Semiconductor

S.o.i.tec Silicon on Insulator Technologies

patents

7. 1 out of 1,099

Shin-Etsu Handotai Co., Ltd.

patents

where one patent can have more than one assignee

Years Active: 2010-2024

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17 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11965730 - Method for measuring film thickness distribution of wafer with thin films (2024-04-23),

2. 11092644 - Method and system for inspecting boards for microelectronics or optics by laser doppler effect (2021-08-17),

3. 11005418 - Device for testing a concentrated photovoltaic module (2021-05-11),

4. 10432140 - Method for testing a concentrated photovoltaic module (2019-10-01),

5. 10260868 - Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics (2019-04-16),

6. 10240977 - Method for 2D/3D inspection of an object such as a wafer (2019-03-26),

7. 10082425 - Integrated chromatic confocal sensor (2018-09-25),

8. 9859842 - Device and method for testing a concentrated photovoltaic module (2018-01-02),

9. 9857313 - Method and system for inspecting wafers for electronics, optics or optoelectronics (2018-01-02),

10. 9816942 - Device and method for inspecting semiconductor materials (2017-11-14),

11. 9739600 - Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer (2017-08-22),

12. 9494529 - Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution (2016-11-15),

13. 9389189 - Dark-field semiconductor wafer inspection device (2016-07-12),

14. 9007456 - Device and method for inspecting semiconductor wafers (2015-04-14),

15. 8817249 - Device and method for inspecting moving semiconductor wafers (2014-08-26),

Title: The Innovative Mind of Philippe Gastaldo

Introduction: Philippe Gastaldo, a distinguished inventor hailing from Pontcharra, France, is renowned for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Philippe Gastaldo's recent patents showcase his expertise in developing cutting-edge solutions for various industries, including renewable energy, transportation, and healthcare.

Career Highlights: With a career spanning over two decades, Gastaldo has established himself as a visionary inventor with a keen eye for identifying gaps in the market and creating innovative solutions to address them. His inventions have not only revolutionized existing technologies but have also set new benchmarks for future advancements.

Collaborations: Throughout his career, Philippe Gastaldo has collaborated with leading research institutions, universities, and companies to bring his inventions to life. His ability to work seamlessly with multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: In conclusion, Philippe Gastaldo's relentless pursuit of innovation and his passion for pushing the boundaries of what is possible have solidified his position as a trailblazing inventor in the world of technology. His contributions continue to inspire the next generation of inventors and shape the future of various industries.