The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

May. 11, 2009
Applicants:

Philippe Gastaldo, Pontcharra, FR;

François Berger, Four, FR;

Cleonisse Serrecchia, Chapareillan, FR;

Inventors:

Philippe Gastaldo, Pontcharra, FR;

François Berger, Four, FR;

Cleonisse Serrecchia, Chapareillan, FR;

Assignee:

Altatech Semiconductor, Montbonnot-Saint-Martin, FR;

Attorneys:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H01L 21/67 (2006.01); G01N 21/95 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67288 (2013.01); G01N 21/9501 (2013.01); H01L 21/68707 (2013.01);
Abstract

Semiconductor wafer inspection device comprising a wager transport arm provided with at least one wafer support element, a wafer gripper, the gripper having two distant branches designed to take hold of the opposed edges of the wafer, the gripper being mounted so as to rotate on a shaft in order to be able to rotate the wafer between an approximately horizontal position and an approximately vertical position, and at least two inspection systems placed on one side of the wafer and on the other, in an approximately vertical position symmetrically with respect to the plane passing through the wafer.


Find Patent Forward Citations

Loading…