The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Mar. 14, 2017
Applicant:

Unity Semiconductor, Montbonnot-Saint-Martin, FR;

Inventors:

Philippe Gastaldo, Pontcharra, FR;

Mayeul Durand De Gevigney, Chambéry, FR;

Tristan Combier, Grenoble, FR;

Assignee:

UNITY SEMICONDUCTOR, Montbonnot-Saint-Martin, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/308 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/308 (2013.01); G01R 31/2831 (2013.01);
Abstract

A method for inspecting a wafer including:


Find Patent Forward Citations

Gastaldo, Philippe. (2021). Method and system for inspecting boards for microelectronics or optics by laser doppler effect (U.S. Patent No. 11092644). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11092644

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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