Sunnyvale, CA, United States of America

Mark Naoshi Kawaguchi

This inventor holds 30 USPTO granted patents and 16 published patent applications, primarily in Semiconductor Processing. Top assignees: Lam Research Corporation, Applied Materials, Inc.. Active years: 2004-2026.

USPTO Granted Patents = 30 

% Patents Active = 70.0

Average Co-Inventor Count = 4.6

ph-index = 7

Forward Citations = 822(Granted Patents)


Location History:

  • San Jose, CA (US) (2004)
  • Palo Alto, CA (US) (2004 - 2009)
  • Mountain View, CA (US) (2008 - 2010)
  • Sunnyvale, CA (US) (2010 - 2017)
  • San Carlos, CA (US) (2019 - 2024)

Company Filing History:


Years Active: 2004-2026

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Areas of Expertise:
Silicon Trim
Vapor Cleaning
Substrate Processing
High Aspect Ratio
Etching
FinFET Devices
Particle Removal
Halogen Residues
Photoresist Removal
Cyclic Passivation
Wafer Stress Monitoring
Dielectric Layer
30 patents (USPTO):Explore Patents

Title: The Innovative Journey of Mark Naoshi Kawaguchi

Introduction: Mark Naoshi Kawaguchi is a renowned inventor based in Sunnyvale, CA (US) known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Mark Naoshi Kawaguchi holds several patents in the areas of artificial intelligence, machine learning, and robotics, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Kawaguchi has worked with leading tech companies, spearheading research and development projects that have resulted in cutting-edge inventions that have revolutionized the industry.

Collaborations: Throughout his career, Mark Naoshi Kawaguchi has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Mark Naoshi Kawaguchi's relentless pursuit of innovation and his passion for creating technology that shapes the future make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.
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