Kanagawa, Japan

Mamoru Nakasuji



Average Co-Inventor Count = 1.8

ph-index = 22

Forward Citations = 1,760(Granted Patents)

Forward Citations (Not Self Cited) = 1,495(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Kawasaki, JP (2000)
  • Yokohama-shi, Kanagawa-ken, JP (2000 - 2003)
  • Kanagawa-ken, JP (1997 - 2008)
  • Kanagawa, JP (2003 - 2014)
  • Yokohama, JP (1997 - 2016)
  • Tokyo, JP (2011 - 2016)

Company Filing History:


Years Active: 1997-2016

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Areas of Expertise:
Electron Beam Inspection
Charged Particle Beam
Semiconductor Manufacturing
Defect Inspection
Aberration Correction
Device Fabrication
Pattern Evaluation
Electric Discharge Machining
Optical Inspection Apparatus
Sample Repairing Method
Testing Apparatus
Device Production Method
127 patents (USPTO):Explore Patents

Title: Mamoru Nakasuji: Pioneering Innovator in Electron Beam Technology

Introduction:

Mamoru Nakasuji is a highly accomplished inventor and innovator hailing from Kanagawa, JP. With an impressive track record and a remarkable number of patents to his name, Nakasuji has made significant contributions to the field of electron beam technology. His expertise and groundbreaking ideas have revolutionized inspection apparatus and manufacturing methods. In this article, we will delve into Nakasuji's latest patents, career highlights, notable collaborations, and his significant impact on the industry.

Latest Patents:

One of Nakasuji's latest patents is for an electro-optical inspection apparatus using an electron beam. This revolutionary technology captures images by deflecting a primary electron beam to irradiate sub-visual fields within an evaluation area on a sample surface. The detecting device comprises a plurality of unit detectors, each consisting of an area sensor, optical fibers, and a focused scintillator. The secondary electron beams emitted from respective sub-visual fields are deflected and moved over the surfaces of the scintillators, allowing for comprehensive and accurate inspection.

Another remarkable patent is for an inspection system using charged particle beams and a corresponding method for manufacturing devices. This invention combines an electron-optical system for irradiating objects with a primary electron beam and a detector that captures the projected secondary electron image. The system incorporates a stage system for holding and moving objects, a mini-environment chamber to supply clean gas, a working chamber with a vacuum atmosphere, loading chambers, and a loader for transferring objects. This comprehensive approach ensures efficient and reliable inspections while minimizing contamination risks.

Career Highlights:

Throughout his career, Nakasuji has worked with distinguished organizations such as Nikon Corporation and Ebara Corporation. These renowned companies provide platforms for innovation, research, and development, allowing Nakasuji to bring his visionary ideas to life. His contributions have had a profound impact on the field of electron beam technology and have advanced inspection methodologies and manufacturing processes.

Collaborations:

Nakasuji has collaborated with accomplished researchers and inventors, including Tohru Satake and Nobuharu Noji. These productive partnerships have fostered the exchange of knowledge and the development of groundbreaking technologies. As a result, Nakasuji and his collaborators have collectively contributed their expertise to numerous successful projects, shaping the future of the industry.

Conclusion:

Mamoru Nakasuji stands out as an exceptional innovator in the field of electron beam technology. With an extensive portfolio of patents, including his latest contributions to electro-optical inspection apparatus and inspection systems, Nakasuji has pushed the boundaries of what is possible in the industry. His career highlights with prominent companies like Nikon Corporation and Ebara Corporation, along with his collaborations with esteemed colleagues, have allowed his ideas and inventions to reach new heights. Nakasuji's impact on the sector is truly remarkable, revolutionizing inspection methods and enhancing device manufacturing processes.

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