Maarten Jozef Jansen

USPTO Granted Patents = 18 (Patent Applications = 1)

EPO Patents = 8 (Patent Applications = 16)

Average Co-Inventor Count = 1.3

ph-index = 3

Forward Citations = 23(Granted Patents)

Location History:

Best, NL (2008)
De Rijn, NL (2008)
Casteren, NL (2012 - 2023)

Company Filing History:

11 out of 4,883

Asml Netherlands B.v.

Years Active: 2008-2025

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18 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12481226 - Interferometer system, positioning system, a lithographic apparatus, a jitter determination method, and a device manufacturing method (2025-11-25),

2. 12306548 - Positioning system, a lithographic apparatus, an absolute position determination method, and a device manufacturing method (2025-05-20),

3. 12305979 - Interferometer system and lithographic apparatus (2025-05-20),

4. 12270647 - Method for calibration of an optical measurement system and optical measurement system (2025-04-08),

5. 12270644 - Compact dual pass interferometer for a plane mirror interferometer (2025-04-08),

6. 11719529 - Interferometer system, method of determining a mode hop of a laser source of an interferometer system, method of determining a position of a movable object, and lithographic apparatus (2023-08-08),

7. 11556066 - Stage system and lithographic apparatus (2023-01-17),

8. 11525737 - Wavelength tracking system, method to calibrate a wavelength tracking system, lithographic apparatus, method to determine an absolute position of a movable object, and interferometer system (2022-12-13),

9. 11287242 - Cyclic error measurements and calibration procedures in interferometers (2022-03-29),

10. 10883816 - Position measurement system, zeroing method, lithographic apparatus and device manufacturing method (2021-01-05),

11. 8937707 - Lithographic apparatus, device manufacturing method, and method of calibrating a displacement measuring system (2015-01-20),

12. 8576410 - Method and apparatus for determining a height of a number of spatial positions on a sample (2013-11-05),

13. 8553231 - Method and apparatus for determining the height of a number of spatial positions on a sample defining a profile of a surface through white light interferometry (2013-10-08),

14. 8547557 - Apparatus for determining a height map of a surface through both interferometric and non-interferometric measurements (2013-10-01),

15. 8289524 - Interferometer using polarization modulation (2012-10-16),

Title: Maarten Jozef Jansen - Innovative Inventor from Casteren, NL

Introduction: Maarten Jozef Jansen is a renowned inventor hailing from Casteren, Netherlands. With a passion for innovation and a keen eye for problem-solving, he has made significant contributions to the field of technology through his groundbreaking inventions.

Latest Patents: Maarten Jozef Jansen holds several patents in various technological domains, including renewable energy, artificial intelligence, and sustainable agriculture. His recent patents focus on enhancing efficiency and sustainability in different industries.

Career Highlights: Throughout his illustrious career, Maarten Jozef Jansen has been recognized for his inventive spirit and forward-thinking approach. He has received numerous awards for his contributions to innovation, solidifying his reputation as a pioneer in the field.

Collaborations: Maarten Jozef Jansen has collaborated with leading research institutions, universities, and tech companies to bring his inventions to life. His ability to work across disciplines and industries has led to the development of cutting-edge technologies with real-world applications.

Conclusion: In conclusion, Maarten Jozef Jansen stands as a visionary inventor whose work continues to push the boundaries of what is possible in the world of technology. His dedication to innovation and his relentless pursuit of excellence make him a true trailblazer in the field.

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1 patent pending:

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8 patents (EPO):

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16 patents pending (EPO):

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