The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

Oct. 20, 2010
Applicants:

Katherine Mary Medicus, Tilburg, NL;

Maarten Jozef Jansen, Casteren, NL;

Inventors:

Katherine Mary Medicus, Tilburg, NL;

Maarten Jozef Jansen, Casteren, NL;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and an apparatus for determining the height of a number of spatial positions on the sample, defining a height map of a surface through interferometry with a broadband light source. The method can involve for each spatial position: obtaining a correlogram during scanning of the surface plane of the objective and estimating the point of the correlogram where an amplitude of the correlogram is at its maximum, thus determining an approximation of the height of the spatial position on the sample. The estimation of the value where the correlogram has its maximum can involve subjecting the correlogram to a Fourier transform, subjecting the Fourier transformed signal to a filter, subjecting the filtered signal to an inverse Fourier transform, and calculating the location of the center of mass of the inversed filtered Fourier transformed signal.


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