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USPTO Data Jan 1 1976 - Oct 27 2026
1,679 Patents
#6 in Kawasaki
#139 in Japan
#602 in the World
Mitutoyo Corporation
Forward Citations = 13,019
743 inventors:
Mitutoyo Corporation
Calculating rank
% Expired Patents = 10.4
EPO Patents = 482
Trademarks = 28
Forward Citations = 13,019
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743 inventors (with patents filed for the assignee):
Sadayuki Matsumiya (83 out of 99 patents)
Shigeru Ohtani (77 out of 84 patents)
Joseph Daniel Tobiason (57 out of 57 patents)
4. Michael Nahum (50 out of 50 patents)
5. Paul Gerard Gladnick (44 out of 48 patents)
6. Kazuhiko Hidaka (39 out of 39 patents)
7. Yoshiro Asano (35 out of 47 patents)
8. Ted Staton Cook (33 out of 33 patents)
9. Robert Kamil Bryll (33 out of 33 patents)
10. Shuji Hayashida (33 out of 33 patents)
11. Tatsuya Nagahama (30 out of 30 patents)
12. Kim W Atherton (30 out of 32 patents)
13. David William Sesko (28 out of 28 patents)
14. Takashi Noda (28 out of 28 patents)
15. Nils Ingvar Andermo (28 out of 31 patents)
Core Competencies:
Measurement Method
Optical Encoder
Inductive Position Encoder
Surface Shape Measurement
Calibration Method
Image Measurement System
Non-Contact Probe
Digital Holography
Measuring Tool
Three-Dimensional Measurement
Position Detection
Micrometer
1,679 patents:
Company Overview
Mitutoyo Corporation, headquartered in Kawasaki, Japan, specializes in advanced metrology systems that enhance precision in measurement and quality control across various industries. The company develops a wide range of technologies, including measurement methods, optical and inductive position encoders, and image measurement systems. Mitutoyo is recognized for its innovations in non-contact probing and digital holography, providing solutions that support manufacturing excellence and ensure product reliability globally.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mitutoyo Corporation. Retrieved from https://idiyas.com/company/mitutoyo
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
482 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]