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For the Inventor, By the Inventor

Kawasaki, Japan

Mitutoyo Corporation


USPTO Granted Patents = 1,677

% Expired Patents = 10.4


Trademarks = 28

Forward Citations = 13,019

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742 inventors (with patents filed for the assignee):

goldMedal Sadayuki Matsumiya (83 out of 99 patents)

silverMedal Shigeru Ohtani (77 out of 84 patents)

bronzeMedal Joseph Daniel Tobiason (57 out of 57 patents)

4.  Michael Nahum (50 out of 50 patents)

5.  Paul Gerard Gladnick (44 out of 48 patents)

6.  Kazuhiko Hidaka (39 out of 39 patents)

7.  Yoshiro Asano (35 out of 47 patents)

8.  Ted Staton Cook (33 out of 33 patents)

9.  Robert Kamil Bryll (33 out of 33 patents)

10.  Shuji Hayashida (33 out of 33 patents)

11.  Tatsuya Nagahama (30 out of 30 patents)

12.  Kim W Atherton (30 out of 32 patents)

13.  David William Sesko (28 out of 28 patents)

14.  Takashi Noda (28 out of 28 patents)

15.  Nils Ingvar Andermo (28 out of 31 patents)


Core Competencies:
Measurement Method
Optical Encoder
Inductive Position Encoder
Surface Shape Measurement
Calibration Method
Image Measurement System
Non-Contact Probe
Digital Holography
Measuring Tool
Three-Dimensional Measurement
Position Detection
Micrometer

1,677 patents:

1. D1149738 - Grip for height gauge (2026-09-29),
2. D1148562 - Knob for height gauge (2026-09-22),
3. D1148561 - Display for height gauge (2026-09-22),
4. D1148560 - Height gauge (2026-09-22),
5. 12739517 - Image detection device and image detection method for reducing focusing recovery time (2026-09-15),
6. 12732676 - Variable focal length lens device (2026-09-08),
7. 12732026 - Measuring instrument, wireless power transfer apparatus, and wireless power transfer system (2026-09-08),
8. 12729944 - Automatic inside-diameter measuring apparatus (2026-09-08),
9. 12722230 - Scale, encoder and manufacturing method of scale (2026-09-01),
10. 12710269 - CALIBRATION METHOD AND MEASUREMENT SYSTEM (2026-08-18),
11. 12710268 - CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM (2026-08-18),
12. D1139313 - Display device (2026-08-04),
13. 12682495 - Automatic measuring systems and control method for automatic measuring systems (2026-07-14),
14. 12681167 - Radar metrology system (2026-07-14),
15. 12681029 - Automatic measuring system and control method for automatic measuring system (2026-07-14),
Mitutoyo Corporation, headquartered in Kawasaki, Japan, specializes in advanced metrology systems that enhance precision in measurement and quality control across various industries. The company develops a wide range of technologies, including measurement methods, optical and inductive position encoders, and image measurement systems. Mitutoyo is recognized for its innovations in non-contact probing and digital holography, providing solutions that support manufacturing excellence and ensure product reliability globally.
Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Oct 6 2026

Mitutoyo Corporation
1,677 Patents

#6 in Kawasaki

#139 in Japan

#601 in the World

Kawasaki, JP
Kawasaki, Japan

Mitutoyo Corporation

Forward Citations = 13,019

742 inventors:

goldMedal Sadayuki Matsumiya (83 out of 99 patents)

silverMedal Shigeru Ohtani (77 out of 84 patents)

bronzeMedal Joseph Daniel Tobiason (57 out of 57 patents)

4.  Michael Nahum (50 out of 50 patents)

5.  Paul Gerard Gladnick (44 out of 48 patents)

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