The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Feb. 28, 2024
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Kazuhiko Hidaka, Tokyo, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01);
Abstract

A production line in which a workpiece is conveyed through a conveyance path and machined with a machine tool is provided with a coordinate measuring machine capable of measuring the workpiece subjected to machining with the machine tool, whereby an in-line measurement system is provided. The coordinate measuring machine includes: a measuring machine body located beside the machine tool; a support extending from the measuring machine body to the machine tool; and a probe supported by the support and configured to measure the workpiece subjected to machining with the machine tool.


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Hidaka, Kazuhiko. (2026). Coordinate measuring machine and in-line measurement system (U.S. Patent No. 12782113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782113

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