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For the Inventor, By the Inventor

Bothell, WA, United States of America

Robert Kamil Bryll

This inventor holds 33 USPTO granted patents and 2 published patent applications and 7 EPO patents, primarily in Machine Vision Systems. Top assignee: Mitutoyo Corporation. Active years: 2008-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Kamil Bryll. Retrieved from https://idiyas.com/inventor/robert-kamil-bryll

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 33 

% Patents Active = 81.8

 

Average Co-Inventor Count = 1.5

ph-index = 13

Forward Citations = 539(Granted Patents)


Company Filing History:

goldMedal33 out of 1,679 
 
Mitutoyo Corporation
 patents

Years Active: 2008-2026

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Areas of Expertise:
Machine Vision
Optical Systems
Edge Detection
Autofocus
Image Processing
Metrology
Lens Systems
Defect Detection
Calibration
Image Correlation
Depth of Field
Illumination
33 patents (USPTO):Explore Patents
1. 12574625 - System with lighting control including grouped channels (2026-03-10),
2. 11430105 - Workpiece inspection and defect detection system including monitoring of workpiece images (2022-08-30),
3. 11150200 - Workpiece inspection and defect detection system indicating number of defect images for training (2021-10-19),
4. 10880468 - Metrology system with transparent workpiece surface mode (2020-12-29),
5. 10341646 - Variable focal length lens system with optical power monitoring (2019-07-02),
6. 10281700 - Variable focal length lens system including a focus state reference subsystem (2019-05-07),
7. 10178321 - Machine vision inspection system and method for obtaining an image with an extended depth of field (2019-01-08),
8. 10171725 - Variable focal length lens system including a focus state reference subsystem (2019-01-01),
9. 10101572 - Variable focal length lens system with multi-level extended depth of field image processing (2018-10-16),
10. 9961253 - Autofocus system for a high speed periodically modulated variable focal length lens (2018-05-01),
11. 9930243 - Variable focal length imaging system (2018-03-27),
12. 9830694 - Multi-level image focus using a tunable lens in a machine vision inspection system (2017-11-28),
13. 9774765 - Chromatic aberration correction in imaging system including variable focal length lens (2017-09-26),
14. 9740190 - Method for programming a three-dimensional workpiece scan path for a metrology system (2017-08-22),
15. 9736355 - Phase difference calibration in a variable focal length lens system (2017-08-15),

Title: The Innovative Journey of Robert Kamil Bryll

Introduction: Robert Kamil Bryll, a talented inventor based in Bothell, WA, has made significant contributions to the field of technology with his creative solutions and groundbreaking ideas.

Latest Patents: Robert Kamil Bryll holds several patents in various technological areas, including artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and innovative thinking.

Career Highlights: Throughout his career, Robert Kamil Bryll has worked with leading tech companies, research institutions, and universities to develop cutting-edge technologies that have the potential to revolutionize industries and improve people's lives.

Collaborations: Known for his collaborative spirit, Robert Kamil Bryll has partnered with fellow inventors, patent attorneys, and industry experts to bring his ideas to life and navigate the complex world of patents and intellectual property.

Conclusion: Robert Kamil Bryll's passion for innovation, coupled with his dedication to pushing the boundaries of technology, continues to inspire the next generation of inventors and entrepreneurs. His impact on the tech industry is truly remarkable, and his legacy will undoubtedly endure for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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