Kentaro Osawa

This inventor holds 18 USPTO granted patents and 4 published patent applications. Top assignees: Hitachi-Lg Data Storage, Inc., Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 2016-2026.

USPTO Granted Patents = 18 (Patent Applications = 4)

% Patents Active = 55.6

Average Co-Inventor Count = 2.3

ph-index = 2

Forward Citations = 8(Granted Patents)

Company Filing History:

11 out of 389

Hitachi-Lg Data Storage, Inc.

patents

5 out of 1,372

Hitachi High-Tech Corporation

patents

1 out of 2,874

Hitachi-High-Technologies Corporation

Years Active: 2016-2026

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18 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12693206 - Particle measuring apparatus (2026-07-28),

2. 12510459 - Particle measurement device, particle measurement method, sample container (2025-12-30),

3. 12422401 - Capillary electrophoresis device (2025-09-23),

4. 12411109 - Capillary electrophoresis device (2025-09-09),

5. 10746528 - Optical image measurement apparatus and optical image measurement method (2020-08-18),

6. 10717962 - Cell culture device and image analysis device (2020-07-21),

7. 10041874 - Optical measurement method and appartus (2018-08-07),

8. 10006755 - Optical measurement apparatus and optical measurement method (2018-06-26),

9. 9772178 - Optical measuring device (2017-09-26),

10. 9759545 - Optical tomograph and optical tomographic method (2017-09-12),

11. 9658054 - Optical measuring apparatus (2017-05-23),

12. 9638510 - Optical tomography observation apparatus (2017-05-02),

13. 9625389 - Light measuring device and light measuring method (2017-04-18),

14. 9625380 - Optical coherence tomography with homodyne-phase diversity detection (2017-04-18),

15. 9593935 - Optical image measuring apparatus (2017-03-14),

Title: Kentaro Osawa: Innovator in Particle Measurement Technology

Introduction

Kentaro Osawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of particle measurement technology, holding a total of 18 patents. His work focuses on improving measurement accuracy and user experience in various applications.

Latest Patents

Osawa's latest patents include a particle measurement device and method, as well as a sample container. The objective of his invention is to enhance measurement accuracy based on the refractive index while minimizing the user's burden of inputting the refractive index of a particle or solvent. The particle measurement device specifies the boundary position between a light transmitting window and a sample along the optical axis direction. It calculates the refractive index of the sample using a known sample's refractive index at the boundary position and the refractive index of the light transmitting window. Another notable invention is a capillary electrophoresis device, which features a light source, a mirror for reciprocally transmitting light through a capillary, and a measurement photodiode that detects optical signals based on the light transmitted through the capillary.

Career Highlights

Throughout his career, Kentaro Osawa has worked with notable companies such as Hitachi-LG Data Storage, Inc. and Hitachi High-Tech Corporation. His experience in these organizations has contributed to his expertise in developing innovative measurement technologies.

Collaborations

Osawa has collaborated with talented individuals in his field, including Daisuke Tomita and Masaki Mukoh. Their joint efforts have further advanced the development of particle measurement technologies.

Conclusion

Kentaro Osawa is a distinguished inventor whose work in particle measurement technology has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to improving measurement accuracy and user experience.