This inventor holds 18 USPTO granted patents and 4 published patent applications, primarily in Optical Measurement Technology. Top assignees: Hitachi-Lg Data Storage, Inc., Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 2016-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
11 out of 389 
5 out of 1,414 
1 out of 2,874 
Years Active: 2016-2026
Areas of Expertise:
Title: Kentaro Osawa: Innovator in Particle Measurement Technology
Introduction
Kentaro Osawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of particle measurement technology, holding a total of 18 patents. His work focuses on improving measurement accuracy and user experience in various applications.
Latest Patents
Osawa's latest patents include a particle measurement device and method, as well as a sample container. The objective of his invention is to enhance measurement accuracy based on the refractive index while minimizing the user's burden of inputting the refractive index of a particle or solvent. The particle measurement device specifies the boundary position between a light transmitting window and a sample along the optical axis direction. It calculates the refractive index of the sample using a known sample's refractive index at the boundary position and the refractive index of the light transmitting window. Another notable invention is a capillary electrophoresis device, which features a light source, a mirror for reciprocally transmitting light through a capillary, and a measurement photodiode that detects optical signals based on the light transmitted through the capillary.
Career Highlights
Throughout his career, Kentaro Osawa has worked with notable companies such as Hitachi-LG Data Storage, Inc. and Hitachi High-Tech Corporation. His experience in these organizations has contributed to his expertise in developing innovative measurement technologies.
Collaborations
Osawa has collaborated with talented individuals in his field, including Daisuke Tomita and Masaki Mukoh. Their joint efforts have further advanced the development of particle measurement technologies.
Conclusion
Kentaro Osawa is a distinguished inventor whose work in particle measurement technology has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to improving measurement accuracy and user experience.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile