The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Oct. 16, 2017
Applicant:

Hitachi-lg Data Storage, Inc., Tokyo, JP;

Inventor:

Kentaro Osawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/23 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02011 (2013.01); G01B 9/02041 (2013.01); G01B 9/02091 (2013.01); G01N 21/23 (2013.01); G01B 2290/45 (2013.01); G01B 2290/70 (2013.01);
Abstract

Exemplary embodiments relate to providing an optical image measurement apparatus that is capable of acquiring information on birefringence of a sample while suppressing size and cost of the apparatus. In the present disclosure: second measurement light different from first measurement light is generated using a passive optical element that generates light of second polarization state different from first polarization state; a time when the first measurement light is irradiated onto a sample is adjusted at a first time, and a time when the second measurement light is irradiated onto the sample is adjusted at a second time different from the first time.


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