The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Sep. 04, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masaki Mukoh, Tokyo, JP;

Tatsuro Ide, Tokyo, JP;

Kentaro Osawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4795 (2013.01); G01B 9/02081 (2013.01); G01B 9/02091 (2013.01); G01B 2290/70 (2013.01);
Abstract

There is provided an optical tomographic observation device which has a resolving power which is higher than those of a conventional optical tomographic observation device and a confocal microscope by a simple configuration by applying a homodyne phase diversity detection technology and designing so as to satisfy the following formula when λ is a wavelength of a laser light source, Δλ is a wavelength half width at half maximum, NA is a numerical aperture of an objective optical element, S is an effective area of a photodetector, and M is a detection magnification of a detection surface relative to a condensing surface.


Find Patent Forward Citations

Loading…