The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jan. 24, 2022
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
An object of the invention is to improve measurement accuracy depending on a refractive index while reducing a burden of a user inputting a refractive index of a particle or a refractive index of a solvent to a measurement device in a case of measuring a size or density of the particle by light irradiation. A particle measurement device according to the invention specifies a boundary position between a light transmitting window and a sample along an optical axis direction, and calculates a refractive index of the sample using a refractive index of a known sample at the boundary position and a refractive index of the light transmitting window (see FIG.).