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For the Inventor, By the Inventor

Tokyo, Japan

Kenji Terao

This inventor holds 20 USPTO granted patents, primarily in Electron Beam Technology. Top assignees: Ebara Corporation, Nec Corporation, Kabushiki Kaisha Toshiba. Active years: 2002-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Terao. Retrieved from https://idiyas.com/inventor/kenji-terao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 20

% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 60(Granted Patents)


Location History:

  • Fujisawa, JP (2002)
  • Kanagawa-ken, JP (2007)
  • Ohta-ku, JP (2013 - 2014)
  • Tokyp, JP (2014)
  • Tokyo, JP (2003 - 2019)

Company Filing History:

goldMedal16 out of 2,581 
 
Ebara Corporation
 patents
silverMedal4 out of 36,735 
 
Nec Corporation
 patents
bronzeMedal2 out of 53,286 
 
Kabushiki Kaisha Toshiba
 patents
where one patent can have more than one assignee

Years Active: 2002-2019

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Areas of Expertise:
Electron Beam Irradiation
Surface Processing
Inspection Device
Specimen Observation
Electro-Optical Inspection
Dust Collection
Crystal Growth
CDMA Receiver
Path Search Method
Sample Repairing
20 patents (USPTO):Explore Patents
1. 10446404 - Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus (2019-10-15),
2. 10002740 - Inspection device (2018-06-19),
3. 9966227 - Specimen observation method and device using secondary emission electron and mirror electron detection (2018-05-08),
4. 9852878 - Surface processing apparatus (2017-12-26),
5. 9194826 - Electron beam apparatus and sample observation method using the same (2015-11-24),
6. 9105444 - Electro-optical inspection apparatus and method with dust or particle collection function (2015-08-11),
7. 8937283 - Specimen observation method and device using secondary emission electron and mirror electron detection (2015-01-20),
8. 8859984 - Method and apparatus for inspecting sample surface (2014-10-14),
9. 8624182 - Electro-optical inspection apparatus and method with dust or particle collection function (2014-01-07),
10. 8525127 - Method and apparatus for inspecting sample surface (2013-09-03),
11. 8274047 - Substrate surface inspection method and inspection apparatus (2012-09-25),
12. 7952071 - Apparatus and method for inspecting sample surface (2011-05-31),
13. 7829853 - Sample surface observation method (2010-11-09),
14. 7496163 - AGC system, AGC method, and receiver using the AGC system (2009-02-24),
15. 7366263 - Radio communication terminal and radio signal receiving method (2008-04-29),

Title: Kenji Terao - Innovative Inventor from Tokyo

Introduction: Kenji Terao is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenji Terao holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the tech industry, Kenji Terao has worked with leading research institutions and universities to develop cutting-edge solutions that have revolutionized various sectors.

Collaborations: Throughout his career, Kenji Terao has collaborated with top companies and fellow inventors to bring his ideas to life, fostering a culture of innovation and creativity in the industry.

Conclusion: Kenji Terao's passion for pushing the boundaries of technology and his relentless pursuit of innovation make him a true pioneer in the world of inventions, inspiring the next generation of inventors to dream big and create the future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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