Introduction: Ken K Lee, a prolific inventor based in Los Altos, CA, has truly made his mark in the field of microscopy with his groundbreaking innovations. With a remarkable 35 patents to his name, Lee's contributions have significantly advanced the capabilities of 3D microscopy.

Latest Patents: Among his latest patents is a cutting-edge 3D microscope that incorporates insertable components to enable a wide range of imaging and measurement functionalities. These capabilities encompass Nomarski imaging, polarized light imaging, q-DIC imaging, motorized polarized light imaging, PSI, and VSI, showcasing Lee's expertise in pushing the boundaries of microscopy technology.

Career Highlights: Having worked at companies like Ultrapointe Corporation and Zeta Instruments, Inc., Lee has honed his skills and expertise in the field of microscopy. His innovative spirit and dedication to research and development have led to the creation of transformative technologies that have revolutionized the way we view and analyze microscopic structures.

Collaborations: Throughout his career, Lee has collaborated with accomplished professionals such as James Jianguo Xu and Zhen Hou. These collaborations have not only enriched his own work but have also fostered a culture of innovation and knowledge-sharing within the scientific community.

Conclusion: Ken K Lee's remarkable journey as an inventor in the realm of microscopy serves as a testament to his passion for pushing the boundaries of technology. With a strong foundation of patents and a history of successful collaborations, Lee continues to inspire and drive innovation in the field, paving the way for future advancements in microscopy and beyond.

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