For the Inventor, By the Inventor

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San Jose, CA, United States of America

Ultrapointe Corporation

USPTO Granted Patents = 15

Forward Citations = 704

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16 inventors (with patents filed for the assignee):

Ken K Lee (10 out of 36 patents)

Bruce W Worster (6 out of 9 patents)

Christopher R Fairley (5 out of 17 patents)

4. Hans J Hansen (3 out of 9 patents)

5. Ke Han (2 out of 3 patents)

6. Timothy V Thompson (2 out of 3 patents)

7. Lakshman Srinivasan (2 out of 2 patents)

8. Dale E Crane (2 out of 9 patents)

9. James Jianguo Xu (1 out of 24 patents)

10. Abigail A Moorhouse (1 out of 6 patents)

11. M Kent Norton (1 out of 2 patents)

12. Kexing Cecilia Du (1 out of 1 patent)

13. Louis D Calitz (1 out of 1 patent)

14. Alan Helgesson (1 out of 1 patent)

15. Phillip R Rigg (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 6288782 - Method for characterizing defects on semiconductor wafers (2001-09-11),

2. 6167148 - Method and system for inspecting the surface of a wafer (2000-12-26),

3. 6148114 - Ring dilation and erosion techniques for digital image processing (2000-11-14),

4. 5963314 - Laser imaging system for inspection and analysis of sub-micron particles (1999-10-05),

5. 5923430 - Method for characterizing defects on semiconductor wafers (1999-07-13),

6. 5808735 - Method for characterizing defects on semiconductor wafers (1998-09-15),

7. 5798830 - Method of establishing thresholds for image comparison (1998-08-25),

8. 5783814 - Method and apparatus for automatically focusing a microscope (1998-07-21),

9. 5761336 - Aperture optimization method providing improved defect detection and (1998-06-02),

10. 5672861 - Method and apparatus for automatic focusing of a confocal laser (1997-09-30),

11. 5594235 - Automated surface acquisition for a confocal microscope (1997-01-14),

12. 5557113 - Method and structure for generating a surface image of a three (1996-09-17),

13. H001530 - Surface extraction from a three-dimensional data set (1996-05-06),

14. 5504630 - Beam steering apparatus (1996-04-02),

15. 5479252 - Laser imaging system for inspection and analysis of sub-micron particles (1995-12-26),

Ultrapointe Corporation is a leading provider of high-tech solutions for various industries. We specialize in advanced technology products and services, including software development, data analytics, and cybersecurity solutions. Our innovative solutions help businesses optimize their operations and stay ahead of the competition.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 2 2025

15 Patents

#394 in San Jose, CA

#4,862 in California

#20,392 in US

#38,649 in the World

San Jose, CA, United States of America

Ultrapointe Corporation

Forward Citations = 704

16 inventors:

Ken K Lee (10 out of 36 patents)

Bruce W Worster (6 out of 9 patents)

Christopher R Fairley (5 out of 17 patents)

4. Hans J Hansen (3 out of 9 patents)

5. Ke Han (2 out of 3 patents)

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