For the Inventor, By the Inventor

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San Jose, CA, United States of America

Ultrapointe Corporation

USPTO Granted Patents = 15

Forward Citations = 713

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16 inventors (with patents filed for the assignee):

Ken K Lee (10 out of 36 patents)

Bruce W Worster (6 out of 9 patents)

Christopher R Fairley (5 out of 17 patents)

4. Hans J Hansen (3 out of 9 patents)

5. Ke Han (2 out of 3 patents)

6. Timothy V Thompson (2 out of 3 patents)

7. Lakshman Srinivasan (2 out of 2 patents)

8. Dale E Crane (2 out of 9 patents)

9. James Jianguo Xu (1 out of 24 patents)

10. Abigail A Moorhouse (1 out of 6 patents)

11. M Kent Norton (1 out of 2 patents)

12. Kexing Cecilia Du (1 out of 1 patent)

13. Louis D Calitz (1 out of 1 patent)

14. Alan Helgesson (1 out of 1 patent)

15. Phillip R Rigg (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 6288782 - Method for characterizing defects on semiconductor wafers (2001-09-11),

2. 6167148 - Method and system for inspecting the surface of a wafer (2000-12-26),

3. 6148114 - Ring dilation and erosion techniques for digital image processing (2000-11-14),

4. 5963314 - Laser imaging system for inspection and analysis of sub-micron particles (1999-10-05),

5. 5923430 - Method for characterizing defects on semiconductor wafers (1999-07-13),

6. 5808735 - Method for characterizing defects on semiconductor wafers (1998-09-15),

7. 5798830 - Method of establishing thresholds for image comparison (1998-08-25),

8. 5783814 - Method and apparatus for automatically focusing a microscope (1998-07-21),

9. 5761336 - Aperture optimization method providing improved defect detection and (1998-06-02),

10. 5672861 - Method and apparatus for automatic focusing of a confocal laser (1997-09-30),

11. 5594235 - Automated surface acquisition for a confocal microscope (1997-01-14),

12. 5557113 - Method and structure for generating a surface image of a three (1996-09-17),

13. H001530 - Surface extraction from a three-dimensional data set (1996-05-06),

14. 5504630 - Beam steering apparatus (1996-04-02),

15. 5479252 - Laser imaging system for inspection and analysis of sub-micron particles (1995-12-26),

Company Overview

Ultrapointe Corporation, based in San Jose, California, specializes in advanced technology solutions, focusing on the development and manufacturing of innovative products in the fields of electronics and software. The company is dedicated to enhancing performance and efficiency across various applications, leveraging cutting-edge research in areas such as automation and smart systems. With a commitment to quality and innovation, Ultrapointe aims to address the evolving needs of industries through its technological advancements.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

15 Patents

#418 in San Jose, CA

#5,027 in California

#21,052 in US

#39,921 in the World

San Jose, CA, United States of America

Ultrapointe Corporation

Forward Citations = 713

16 inventors:

Ken K Lee (10 out of 36 patents)

Bruce W Worster (6 out of 9 patents)

Christopher R Fairley (5 out of 17 patents)

4. Hans J Hansen (3 out of 9 patents)

5. Ke Han (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ultrapointe Corporation. Retrieved from https://idiyas.com/company/ultrapointe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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