Kexing Cecilia Du

Title: Kexing Cecilia Du: Innovator in Wafer Surface Inspection Technology

Introduction

Kexing Cecilia Du is a prominent inventor based in Mountain View, CA (US). She has made significant contributions to the field of wafer surface inspection technology. With a focus on improving the efficiency and accuracy of inspection systems, her work has implications for quality control in semiconductor manufacturing.

Latest Patents

Kexing Cecilia Du holds a patent for a "Method and system for inspecting the surface of a wafer." This innovative patent describes an improved wafer surface inspection system that utilizes a translation stage to generate relative motion between an object viewing device and the surface of the object being inspected. The system includes a translation stage controller that manages the movement and captures images of the wafer surface efficiently. This technology allows for quick and effective identification of solder bumps and the application of quality control criteria to ensure the suitability of wafers for further processing.

Career Highlights

Kexing Cecilia Du is associated with Ultrapointe Corporation, where she continues to develop and refine her innovative technologies. Her work has garnered attention for its potential to enhance the semiconductor manufacturing process. With her expertise, she has contributed to advancements that streamline quality control measures in the industry.

Collaborations

Kexing Cecilia Du has worked alongside notable colleagues, including Louis D Calitz and M Kent Norton. Their collaborative efforts have furthered the development of cutting-edge technologies in wafer inspection.

Conclusion

Kexing Cecilia Du's contributions to wafer surface inspection technology exemplify her innovative spirit and dedication to improving manufacturing processes. Her patent and ongoing work at Ultrapointe Corporation highlight her role as a key player in the semiconductor industry.