Bruce W Worster

Title: Innovative Solutions by Bruce W Worster

Introduction

Bruce W Worster, an accomplished inventor based in Saratoga, CA, has significantly contributed to the field of semiconductor technology with an impressive portfolio of nine patents. His innovative approaches to defect characterization in semiconductor wafers have established him as a notable figure in the industry.

Latest Patents

One of Bruce's latest patents focuses on a sophisticated method for characterizing defects on semiconductor wafers. This technique utilizes a confocal-microscope-based automatic defect characterization (ADC) system. In this method, both the test surface and a reference surface of a semiconductor wafer are scanned using a confocal microscope to create three-dimensional images. These images are then transformed into geometric constructs, known as 'primitives,' which help in approximating the features of the surfaces. By comparing the sets of test and reference primitives, the ADC system identifies any discrepancies. If differences are found, the system generates defect parameters that are subsequently matched against a knowledge base of defect reference data, allowing for accurate characterization of the defects with a measurable degree of confidence.

Career Highlights

Bruce has worked with prestigious companies such as Ultrapointe Corporation and KLA-Tencor Corporation, where his expertise has led to significant advancements in semiconductor technology. His career has been marked by a commitment to innovation and solving complex engineering challenges.

Collaborations

Throughout his career, Bruce has collaborated with notable coworkers, including Ken K Lee and Dale E Crane. These partnerships have enabled him to leverage collective expertise in the field, fostering an environment conducive to cutting-edge innovation.

Conclusion

Bruce W Worster's contributions to semiconductor technology demonstrate a remarkable blend of creativity and technical proficiency. His innovative methods for identifying and characterizing defects on semiconductor wafers not only enhance the quality of semiconductor products but also underscore the importance of invention and collaboration in driving technological advancements.