Tokyo, Japan

Kazunari Nakata

USPTO Granted Patents = 17 

Average Co-Inventor Count = 1.6

ph-index = 4

Forward Citations = 26(Granted Patents)


Location History:

  • Chiyoda-ku, JP (2013)
  • Tokyo, JP (2012 - 2024)

Company Filing History:


Years Active: 2012-2024

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17 patents (USPTO):Explore Patents

Title: Kazunari Nakata: Innovator in Power Semiconductor Technology

Introduction

Kazunari Nakata is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of power semiconductor devices, holding a total of 17 patents. His work focuses on enhancing the efficiency and reliability of semiconductor technologies.

Latest Patents

Nakata's latest patents include innovative designs for power semiconductor devices and power converters. One of his notable inventions describes a power semiconductor device that features a termination region with a corner and an element region within it. This device utilizes an SiC substrate that spans both regions, ensuring optimal performance. Additionally, he has developed a semiconductor device that maintains the connection state of electrode layers even under stress from energization or switching operations. This design includes a semiconductor layer of the first conductivity type and an upper surface structure that enhances its functionality.

Career Highlights

Kazunari Nakata is currently employed at Mitsubishi Electric Corporation, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in advancing the capabilities of power conversion devices, making them more efficient and reliable for various applications.

Collaborations

Nakata collaborates with talented colleagues such as Yoshiaki Terasaki and Atsushi Narazaki. Their combined expertise contributes to the innovative projects at Mitsubishi Electric Corporation.

Conclusion

Kazunari Nakata's contributions to power semiconductor technology exemplify his dedication to innovation. His patents reflect a commitment to improving the efficiency and reliability of electronic devices.

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