Jeff Rearick

Title: Jeff Rearick: Innovator in Automatic Test Pattern Generation

Introduction

Jeff Rearick is a prominent inventor based in Ft. Collins, CO (US). He has made significant contributions to the field of automatic test pattern generation, holding a total of 16 patents. His work focuses on improving the efficiency and effectiveness of testing integrated circuits.

Latest Patents

One of Jeff Rearick's latest patents is titled "Hierarchically-controlled automatic test pattern generation." This invention provides a method for automatically generating test patterns for testing a device under test. The method involves receiving a hierarchical model of the device, selecting a fault to be detected, and performing an automatic test pattern generation (ATPG) algorithm based on the hierarchy of the model. Another notable patent is the "Method and apparatus for deriving a bounded set of path delay test patterns covering all transition faults." This invention generates test patterns used to test integrated circuits by determining a subset of transition fault sites and generating a bounded set of test patterns that cover the identified paths.

Career Highlights

Throughout his career, Jeff Rearick has worked with leading technology companies, including Agilent Technologies, Inc. and Hewlett-Packard Company. His experience in these organizations has allowed him to refine his skills and contribute to advancements in the field of integrated circuit testing.

Collaborations

Jeff has collaborated with notable professionals in the industry, including John G Rohrbaugh and Manish Sharma. These collaborations have further enriched his work and contributed to the development of innovative testing solutions.

Conclusion

Jeff Rearick is a distinguished inventor whose work in automatic test pattern generation has significantly impacted the field of integrated circuit testing. His numerous patents and collaborations highlight his dedication to innovation and excellence in technology.