The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2004
Filed:
Nov. 14, 2000
Applicant:
Inventor:
Jeff Rearick, Ft Collins, CO (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A test method and apparatus allows simultaneous loading of multiple scan chains via a single common scan-in port (SDI) and a scan clock signal SCAN CLOCK. Data is scanned into one or more scanpaths from a scan data in (SDI) port under the control of a clock signal, either directly or indirectly through a linear feedback shift register (LFSR). Scan-out data output from the scanpaths may be read at the scan data out (SDO) port, either directly or indirectly through a signature register with optional masking functionality.