The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Feb. 19, 2003
John G Rohrbaugh, Ft Collins, CO (US);
Jeff Rearick, Ft Collins, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Systems and methods for testing integrated circuits are provided. One such method comprises: providing a target fault list corresponding to an integrated circuit, the target fault list including at least a first fault and a second fault; measuring a relationship between the first fault and the second fault, the relationship corresponding to which of the first fault and the second fault is more readily detected by automatic test pattern generation; ordering the first fault and the second fault within the target fault list in a manner corresponding to the relationship; and performing automatic test pattern generation based upon an order of the faults of the target fault list. Systems and other methods also are provided.