The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2003
Filed:
Oct. 08, 2002
Applicant:
Inventors:
Sylvia Patterson, Ft Collins, CO (US);
Jeff Rearick, Ft Collins, CO (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract
Improvement in the transmission of Boundary Scan Test mode data may be achieved through the assignment of boundary scan test mode traffic to selected bit patterns that facilitate clock recovery and frame alignment in the serial channel. The encoding of boundary scan test traffic as such may be achieved through either multiplexed transmission to the serializer/deserializer (SERDES) alongside a regular channel encoder or incorporated into the channel encoder.
Patterson, Sylvia. (2003). Serdes cooperates with the boundary scan test technique (U.S. Patent No. 6653957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6653957
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile