Location History:
- Wilsonville, CA (US) (2004)
- Wilsonville, OR (US) (2006 - 2019)
Company Filing History:
Years Active: 2004-2019
Title: Jay Joseph Nejedlo: Innovator in Test and Validation Architecture
Introduction
Jay Joseph Nejedlo is a prominent inventor based in Wilsonville, OR (US). He has made significant contributions to the field of electronic testing and validation, holding a total of 10 patents. His work focuses on developing innovative architectures that enhance the testing and debugging processes for electronic devices.
Latest Patents
One of Nejedlo's latest patents is centered around a test, validation, and debug architecture. This invention describes an apparatus and method that integrates hardware hooks, known as Design for Test (DFx), into silicon parts. A controller provides abstracted access to these hooks through an abstraction layer, which simplifies the interaction with low-level hardware details. This architecture also offers tiered secure access and a unified, bi-directional test access port, facilitating both physical and remote testing of electronic platforms. Another notable patent introduced the Robust Electrical Unified Testing (REUT) for memory links, which accelerates testing and tool development while providing training hooks for BIOS parameter adjustments.
Career Highlights
Throughout his career, Nejedlo has worked with leading companies in the technology sector, including Intel Corporation and Asset Intertech, Inc. His experience in these organizations has allowed him to refine his expertise in electronic testing and validation.
Collaborations
Nejedlo has collaborated with notable professionals in the industry, including David G Ellis and Bruce Querbach. These partnerships have contributed to the advancement of his innovative projects and patents.
Conclusion
Jay Joseph Nejedlo is a distinguished inventor whose work in test and validation architecture has significantly impacted the electronics industry. His innovative patents and collaborations reflect his commitment to enhancing electronic testing processes.