The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2009

Filed:

Nov. 28, 2005
Applicants:

David Zimmerman, El Dorado Hills, CA (US);

Jay J. Nejedlo, Wilsonville, OR (US);

Inventors:

David Zimmerman, El Dorado Hills, CA (US);

Jay J. Nejedlo, Wilsonville, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In some embodiments, built-in self-test logic is provided for an integrated circuit (IC) device having memory controller logic to generate address and command information for accessing a memory device. Driver circuits are on-chip with the memory controller logic. The driver circuits have outputs that are coupled to on-chip signal pads, respectively. The BIST logic is coupled between the driver circuits and the controller logic. The BIST logic is to transmit, at speed, address and command information that has been generated by the controller logic using the driver circuits in a normal mode of operation for the device. In addition, the BIST logic is able to transmit, at speed, test symbols using the driver circuits in a test mode of operation for the IC device, during which a chip-to-chip connection between the IC device and another device is tested. Other embodiments are also described and claimed.


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