The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Dec. 16, 2002
Applicants:
Jay Nejedlo, Wilsonville, OR (US);
Sean R. Babcock, Portland, OR (US);
Inventors:
Jay Nejedlo, Wilsonville, OR (US);
Sean R. Babcock, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A built-in self test (IBIST) architecture/methodology is provided for testing the functionality of an interconnect (such as a bus) between two components. This IBIST architecture may include a pattern generator and a pattern checker. The pattern checker operates to compare a received plurality of bits (for the pattern generator) with a previously stored plurality of bits.