Sean R Babcock

Title: Sean R Babcock: Innovator in Interconnect Testing Technologies

Introduction

Sean R Babcock is a prominent inventor based in Portland, OR (US). He has made significant contributions to the field of interconnect testing technologies, holding a total of 10 patents. His work primarily focuses on methodologies and apparatuses that enhance the functionality and reliability of interconnects in computer systems.

Latest Patents

Among his latest patents, Babcock has developed a testing methodology and apparatus for interconnects. This built-in self-test (IBIST) architecture provides a systematic approach to testing the functionality of interconnects, such as buses, between two components. The architecture includes a pattern generator and a pattern checker that compares received bits with previously stored bits. Another notable patent is the push button mode automatic pattern switching for interconnect built-in self-test. This innovation allows a built-in self-test (BIST) unit of a primary integrated circuit (IC) component to launch a test pattern in multiple cycles, automatically changing the pin assignment after each cycle without requiring reprogramming.

Career Highlights

Sean R Babcock is currently employed at Intel Corporation, where he continues to innovate and develop new technologies. His work has significantly impacted the efficiency and reliability of interconnect testing in computer systems.

Collaborations

Babcock has collaborated with notable coworkers, including Jerald N Hall and Orville H Christeson, contributing to advancements in their respective fields.

Conclusion

Sean R Babcock's contributions to interconnect testing methodologies have established him as a key figure in the field of technology innovation. His patents reflect a commitment to enhancing the functionality and reliability of computer systems.