The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Aug. 16, 2006
James Ernest Chorn, Tigard, OR (US);
Thomas Green Hudiburgh, Carrollton, TX (US);
Jay Joseph Nejedlo, Wilsonville, OR (US);
Edward Keith Simpson, Anna, TX (US);
Walter Michael Coldewey, Richardson, TX (US);
James Ernest Chorn, Tigard, OR (US);
Thomas Green Hudiburgh, Carrollton, TX (US);
Jay Joseph Nejedlo, Wilsonville, OR (US);
Edward Keith Simpson, Anna, TX (US);
Walter Michael Coldewey, Richardson, TX (US);
Asset Intertech, Inc., Richardson, TX (US);
Abstract
Methods and apparatus for performing a data driven test on a circuit including at least one built-in-self-test compatible device. In one embodiment, the method includes describing the device using a descriptive language including setting at least one default value associated with the device. The method also includes defining a scan path associated with the device, defining a netlist of the circuit, and configuring a test control program for the circuit. Additionally, the method includes changing the default value associated with the device. Testing the circuit after changing the value and using the test control program is also included wherein a portion of the test control program associated with the value remains substantially unmodified.