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For the Inventor, By the Inventor

Halevi, Israel

Itay Gdor

This inventor holds 13 USPTO granted patents and 6 published patent applications, primarily in Overlay Metrology. Top assignee: Kla Corporation. Active years: 2022-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Itay Gdor. Retrieved from https://idiyas.com/inventor/itay-gdor

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 13 

% Patents Active = 100.0

Average Co-Inventor Count = 5.4

ph-index = 3

Forward Citations = 27(Granted Patents)


Location History:

  • Halevi, IL (2022)
  • Tel Aviv, IL (2022 - 2023)

Company Filing History:

goldMedal13 out of 624 
 
Kla Corporation
 patents

Years Active: 2022-2026

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Areas of Expertise:
Overlay Measurement
Diffraction Techniques
Scatterometry
Metrology Target
Fourier Analysis
Spatial Frequencies
Tool Induced Shift
Phase Mask
Pupil Landscape
Semiconductor Devices
Apodizer
Misregistration
13 patents (USPTO):Explore Patents
1. 12761570 - Multi-overlay stacked grating metrology target (2026-10-13),
2. 12716837 - Scanning diffraction based overlay scatterometry (2026-08-25),
3. 12704790 - System and method for determining overlay measurement of a scanning target (2026-08-11),
4. 12669327 - System and method for suppression of tool induced shift in scanning overlay metrology (2026-06-30),
5. 12504697 - Single grab pupil landscape via broadband illumination (2025-12-23),
6. 12487190 - System and method for isolation of specific fourier pupil frequency in overlay metrology (2025-12-02),
7. 12422363 - Scanning scatterometry overlay metrology (2025-09-23),
8. 12373936 - System and method for overlay metrology using a phase mask (2025-07-29),
9. 12105431 - Annular apodizer for small target overlay measurement (2024-10-01),
10. 12105414 - Targets for diffraction-based overlay error metrology (2024-10-01),
11. 11796925 - Scanning overlay metrology using overlay targets having multiple spatial frequencies (2023-10-24),
12. 11409205 - Non-orthogonal target and method for using the same in measuring misregistration of semiconductor devices (2022-08-09),
13. 11378394 - On-the-fly scatterometry overlay metrology target (2022-07-05),

Title: Inventor Itay Gdor - Pioneering Innovations in Halevi, IL

Introduction: Itay Gdor is a visionary inventor based in Halevi, Israel, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Itay Gdor holds several patents in the areas of artificial intelligence, renewable energy, and sustainable technologies, showcasing his commitment to creating a more sustainable future.

Career Highlights: With a career spanning over two decades, Itay Gdor has worked with leading tech companies to develop cutting-edge solutions that have revolutionized industries worldwide.

Collaborations: Itay Gdor has collaborated with top researchers, engineers, and scientists from around the globe, fostering a culture of innovation and excellence in all his projects.

Conclusion: Itay Gdor's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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