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For the Inventor, By the Inventor

Hitachi, Japan

Hiroshi Miyai

This inventor holds 34 USPTO granted patents and 2 published patent applications, primarily in Electron Beam Inspection. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi-Science Systems, Ltd.. Active years: 1997-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Miyai. Retrieved from https://idiyas.com/inventor/hiroshi-miyai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 34 

% Patents Active = 52.9

Average Co-Inventor Count = 4.8

ph-index = 11

Forward Citations = 376(Granted Patents)


Location History:

  • Yokohama, JP (2005)
  • Hitachi, JP (1997 - 2013)

Company Filing History:

goldMedal21 out of 42,743 
 
Hitachi, Ltd.
 patents
silverMedal13 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal2 out of 33 
 
Hitachi-Science Systems, Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1997-2013

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Areas of Expertise:
Electron Beam
Inspection Apparatus
Pattern Check
Semiconductor Device
Charged Particle Beam
Image Generation
Non-Destructive Inspection
Circuit Pattern
Alignment Method
Defect Review
34 patents (USPTO):Explore Patents
1. 8421010 - Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample (2013-04-16),
2. 8421008 - Pattern check device and pattern check method (2013-04-16),
3. 8086022 - Electron beam inspection system and an image generation method for an electron beam inspection system (2011-12-27),
4. 8086021 - Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope (2011-12-27),
5. 8036447 - Inspection apparatus for inspecting patterns of a substrate (2011-10-11),
6. 7999565 - Inspection apparatus and inspection method using electron beam (2011-08-16),
7. 7995833 - Method of alignment for efficient defect review (2011-08-09),
8. 7957579 - Pattern inspection method and apparatus (2011-06-07),
9. 7894658 - Pattern inspection method and apparatus (2011-02-22),
10. 7855363 - Inspection method and apparatus using an electron beam (2010-12-21),
11. 7518383 - Inspection apparatus and inspection method using electron beam (2009-04-14),
12. 7457453 - Pattern inspection method and apparatus (2008-11-25),
13. 7425704 - Inspection method and apparatus using an electron beam (2008-09-16),
14. 7294833 - Method of alignment for efficient defect review (2007-11-13),
15. 7269280 - Method and its apparatus for inspecting a pattern (2007-09-11),

Title: Hiroshi Miyai - Pioneering Inventor at Hitachi

Introduction: Hiroshi Miyai is a renowned inventor based in Hitachi, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hiroshi Miyai holds several patents in various technological domains, showcasing his continuous dedication to pushing the boundaries of innovation.

Career Highlights: Throughout his illustrious career, Hiroshi Miyai has been instrumental in developing cutting-edge technologies that have revolutionized the industry. His innovative solutions have significantly impacted the way we interact with technology on a daily basis.

Collaborations: Hiroshi Miyai has collaborated with leading experts in the field, both within Hitachi and globally, to further his research and bring his inventions to life. His collaborative spirit has led to the creation of groundbreaking technologies that have set new industry standards.

Conclusion: Hiroshi Miyai's relentless pursuit of innovation and his passion for pushing technological boundaries have solidified his position as a pioneering inventor in the world of technology. His contributions continue to inspire future generations of inventors and shape the technological landscape for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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