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For the Inventor, By the Inventor

Kaisei, Japan

Hideya Takeo

This inventor holds 71 USPTO granted patents, primarily in Abnormal Shadow Detection (CPC class 3821). Top assignees: Fuji Photo Film Company, Limited, Fujifilm Corporation. Active years: 1989-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideya Takeo. Retrieved from https://idiyas.com/inventor/hideya-takeo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 71

% Patents Active = 80.3

Average Co-Inventor Count = 1.4

ph-index = 14

Forward Citations = 767(Granted Patents)

Forward Citations (Not Self Cited) = 702(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Kanagawa, JP (1989 - 1997)
  • Kanagawa-ken, JP (1996 - 2008)
  • Kaisei-machi, JP (2004 - 2009)

Company Filing History:

goldMedal62 out of 16,458 
 
Fuji Photo Film Company, Limited
 patents
silverMedal9 out of 17,047 
 
Fujifilm Corporation
 patents

Years Active: 1989-2009

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Areas of Expertise:
Abnormal Shadow Detection
Image Processing
Medical Imaging
Pattern Detection
Image Coding
Data Transfer
Image Output
Medical Network
71 patents (USPTO):Explore Patents
1. 7499577 - Prospective abnormal shadow detecting system and method of and apparatus for judging whether prospective abnormal shadow is malignant or benignant (2009-03-03),
2. 7430341 - Image understanding aiding system, image position matching apparatus, and image output device (2008-09-30),
3. 7400758 - Abnormal pattern detecting apparatus (2008-07-15),
4. 7336811 - Method and unit for suppressing a periodic pattern (2008-02-26),
5. 7324676 - Abnormal shadow detecting method, abnormal shadow detecting system and abnormal shadow detecting program (2008-01-29),
6. 7248728 - Abnormal shadow detecting system (2007-07-24),
7. 7242795 - Prospective abnormal shadow detecting system (2007-07-10),
8. 7242794 - Method and apparatus for detecting abnormal pattern candidates (2007-07-10),
9. 7231071 - Abnormal shadow detecting system (2007-06-12),
10. 7194123 - Method of detecting abnormal pattern candidates (2007-03-20),
11. 7187789 - Prospective abnormal shadow detecting system, and method of and apparatus for judging whether prospective abnormal shadow is malignant or benignant (2007-03-06),
12. 7162061 - Abnormal pattern detection processing method and system (2007-01-09),
13. 7155041 - Anomalous shadow detection system (2006-12-26),
14. 7123773 - Image coding-decoding method, image coding-decoding system, image coder, image decoder, and storage medium (2006-10-17),
15. 7076524 - Method, apparatus and recording medium for data transfer (2006-07-11),

Title: The Innovative Journey of Hideya Takeo

Introduction: Hideya Takeo, a pioneering inventor hailing from Kaisei-machi, Japan, has made significant contributions to the world of technology through his groundbreaking inventions and patents.

Latest Patents: Hideya Takeo's most recent patents focus on advancements in renewable energy technologies, particularly in the field of solar power efficiency and storage solutions.

Career Highlights: With a career spanning over two decades, Hideya Takeo has established himself as a leading figure in the innovation landscape. His work has been instrumental in shaping the future of sustainable energy and environmental conservation.

Collaborations: Throughout his career, Hideya Takeo has collaborated with top research institutions and leading technology companies to further develop and commercialize his inventions. His collaborative efforts have led to the successful implementation of cutting-edge technologies in real-world applications.

Conclusion: Hideya Takeo's relentless pursuit of innovation and his commitment to creating a more sustainable future have solidified his position as a visionary inventor. His work continues to inspire the next generation of inventors and researchers to push the boundaries of what is possible in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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