The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Jan. 24, 2000
Hideya Takeo, Kaisei-machi, JP;
Hideya Takeo, Kaisei-machi, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
The result of detection processing by abnormal pattern detection processor meansis stored in a server. In addition, the output image on an image output deviceis read for pattern, and the supporting contents, such as the result of judgment by a doctor (which, when differing from the result of detection processing, corresponds to the corrected result), the comment, and the assessment category, are stored in the serverin conformity with the BI-RADS proposed by the ACR. The result of pathologic assessment corresponding to the abnormal pattern is related to the supporting contents and stored in the server. The statistical processing in conformity with the follow-up method of the BI-RADS is performed to find the specificity, the cancer detection rate, etc.