The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

Sep. 24, 2001
Applicants:

Takashi Imamura, Kaisei-machi, JP;

Hideya Takeo, Kaisei-machi, JP;

Inventors:

Takashi Imamura, Kaisei-machi, JP;

Hideya Takeo, Kaisei-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Processing, in which a first shape-dependent filter in accordance with a shape of a microcalcification pattern is utilized, is performed on an object image, and a fine structure image, which illustrates a fine structure area embedded in the object image, is formed. Thereafter, enhancement processing, in which a second shape-dependent filter in accordance with the shape of a microcalcification pattern is utilized, is performed on the fine structure image, and an enhancement-processed image, in which the microcalcification pattern has been enhanced, is formed. A microcalcification pattern candidate is then detected by use of the enhancement-processed image.


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