The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Sep. 12, 2002
Applicants:
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Inventors:
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Assignee:
Fujifilm Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/04 (2006.01); G01B 15/02 (2006.01); G01N 23/223 (2006.01); G01N 23/04 (2006.01); G01N 23/201 (2006.01); G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
In an abnormal shadow detecting system, a characteristic value on the shape and/or the density of a prospective area of a micro calcification shadow set in an image of an object is extracted on the basis of image data representing the image of the object, and whether a micro calcification shadow really exists in the prospective area is determined on the basis of the calculated characteristic value.