The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Sep. 18, 2001
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
Processing for detecting an abnormal pattern candidate embedded in a medical image having been obtained from an image recording operation is performed on an image signal representing the medical image. In cases where the image signal is one which has been subjected to predetermined signal processing, correction processing is performed on the image signal such that the abnormal pattern candidate detecting processing performed on the image signal, which has been subjected to the predetermined signal processing, does not depend upon the predetermined signal processing. The abnormal pattern candidate detecting processing is then performed on the image signal, which has been obtained from the correction processing.