The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Dec. 31, 2003
Chao Shi, Kawasaki, JP;
Hideya Takeo, Kaisei-machi, JP;
Chao Shi, Kawasaki, JP;
Hideya Takeo, Kaisei-machi, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Diagnostic assistance to physicians is improved, by increasing detection rates of abnormal pattern candidates having radially extending linear structures, and decreasing false positive detection rates. A linear structure extracting means extracts linear structures from within radiation image of a subject. A linear concentration calculating means calculates linear concentrations of the extracted linear structures with respect to each pixel within the image. A directional distribution index calculating means calculates indices of directional distribution of the extracted linear structures with respect to each pixel of interest. A candidate region detecting means calculates products of the linear concentrations and the indices of directional distribution for each pixel of interest, and detects tumor pattern candidate regions based on the calculated products. Thereby, candidate regions are enabled to be extracted while taking into consideration variance in the directions of linear structures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile