The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Aug. 31, 2001
Applicant:
Hideya Takeo, Kaisei-machi, JP;
Inventor:
Hideya Takeo, Kaisei-machi, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A prospective abnormal shadow detecting system detects a prospective abnormal shadow in an image on the basis of image data representing the image and outputs information on the prospective abnormal shadow detected by the prospective abnormal shadow detecting means. Whether the detected prospective abnormal shadow is malignant or benignant is judged, and the information on the prospective abnormal shadow is output in such a manner that whether the prospective abnormal shadow is malignant or benignant can be distinguished.