The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
Jun. 12, 2002
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Prospective micro calcification points in a radiation image of an object are extracted on the basis of image data representing the radiation image and clustered into cluster areas. A plurality of areas are set in the radiation image, and fluctuation in size and/or fluctuation in density of the prospective micro calcification points in each of the areas is obtained. Detected areas are extracted from the plurality of areas on the basis of the fluctuation in size and/or the fluctuation in density of the prospective micro calcification points in each of the areas, and each interconnected area where a predetermined number of or more extracted detected areas are continuous is set as a cluster area.