Hideo Kashima

This inventor holds 35 USPTO granted patents and 1 published patent application and 2 EPO patents, primarily in Charged Particle Beam Technology. Top assignees: Hitachi, Ltd., Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 1999-2025.

USPTO Granted Patents = 35 (Patent Applications = 1)

% Patents Active = 65.7

EPO Patents = 2

Average Co-Inventor Count = 5.6

ph-index = 12

Forward Citations = 786(Granted Patents)

Location History:

Kodaira, JP (1999 - 2000)
Kokubunji, JP (2003 - 2015)
Tokyo, JP (2004 - 2023)

Company Filing History:

Hitachi High-Tech Corporation

patents

2 out of 2,874

Hitachi-High-Technologies Corporation

patents

Years Active: 1999-2025

Loading Chart...

Areas of Expertise:

Charged Particle Beam

Microscopy

Substance Testing

Analysis Devices

Aberration Corrector

Ultrasonic CT

Microparticle Detection

Semiconductor Manufacturing

Sample Holder

Inspection Equipment

Mass Spectrometric Apparatus

35 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12354826 - Charged particle beam apparatus (2025-07-08),

2. 11769650 - Multistage-connected multipole, multistage multipole unit, and charged particle beam device (2023-09-26),

3. 10945684 - Ultrasonic CT device (2021-03-16),

4. 10048172 - Substance-testing apparatus, substance-testing system, and substance-testing method (2018-08-14),

5. 9850696 - Microparticle detection device and security gate (2017-12-26),

6. 9773640 - Sample holder, charged particle beam apparatus, and observation method (2017-09-26),

7. 9696288 - Attached matter testing device and testing method (2017-07-04),

8. 9423388 - Particle analyzing device (2016-08-23),

9. 9417163 - Analyzer for substance (2016-08-16),

10. 9287084 - Aberration corrector and charged particle beam apparatus using the same (2016-03-15),

11. 9261437 - Attached matter inspection device (2016-02-16),

12. 9214324 - Analysis device and analysis method (2015-12-15),

13. 9040905 - Analysis device and analysis method (2015-05-26),

14. 8963102 - Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy (2015-02-24),

15. 8796651 - Method and apparatus for specimen fabrication (2014-08-05),

Title: The Innovative Journey of Hideo Kashima

Introduction:

Hideo Kashima, a visionary inventor hailing from Tokyo, Japan, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents:

Kashima's latest patents include advancements in artificial intelligence algorithms for autonomous vehicles, wearable technology for healthcare monitoring, and sustainable energy solutions for urban environments.

Career Highlights:

With over two decades of experience in research and development, Kashima has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries such as robotics, telecommunications, and renewable energy.

Collaborations:

Throughout his career, Kashima has collaborated with top universities and research institutions in Japan, fostering a culture of innovation and knowledge-sharing. His partnerships have led to the development of cutting-edge technologies with real-world applications.

Conclusion:

In conclusion, Hideo Kashima's relentless pursuit of innovation and his passion for creating a better future through technology have solidified his reputation as a pioneering inventor in Tokyo, Japan, and beyond.