The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Mar. 24, 2014
Applicant:
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Inventors:
Masakazu Sugaya, Tokyo, JP;
Hideo Kashima, Tokyo, JP;
Koichi Terada, Tokyo, JP;
Yasuaki Takada, Tokyo, JP;
Hisashi Nagano, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01N 1/40 (2006.01); G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2202 (2013.01); G01N 1/4022 (2013.01); G01N 2001/022 (2013.01); G01N 2001/024 (2013.01); G01N 2001/2223 (2013.01); G01N 2001/4033 (2013.01);
Abstract
In order to save a space for an apparatus for inspecting a substance and reduce a cost thereof, a particle testing apparatus includes a plurality of collection ports for collecting substances to be inspected, centrifuges for concentrating particles collected in the collection ports, the centrifuges being connected to the respective collection ports in pairs, and a common analysis apparatus for acquiring the concentrated particles from the centrifuges and analyzing the particles, the analysis apparatus being connected to the centrifuges.